PL Mapping Device
Fully automatable! A device that enables comprehensive mapping.
The "PL Mapping Device" is an apparatus for performing photoluminescence and film thickness mapping measurements on 2, 3, and 4-inch wafers for LED/LD production. With an automatic XY stage and original multifunctional measurement software, comprehensive mapping can be conducted. Additionally, by connecting to an automatic wafer supply and storage mechanism, full automation is possible. 【Features】 ■ Capable of measuring 2, 3, and 4-inch wafers ■ Measurement of 1/4 cut wafers is also possible with options ■ Comprehensive mapping ■ Full automation is possible *For more details, please download the PDF or feel free to contact us.
- Company：ユアサエレクトロニクス
- Price：Other
